About NANOELECTRONIC IMAGING, INC.
NEI provides advanced STEM EBIC imaging and characterization services, specializing in high-resolution electronic and thermal imaging for semiconductor and nanoscale device analysis. Their Two-Channel STEM EBIC system is the only complete solution on the market.
STEM EBIC imagingQuantitative standard EBIC and SEEBIC imagingConductivity mappingTemperature mappingAtomic resolution EBICTwo-channel STEM EBICIn situ biasing and heating experimentsCustom Si-based TEM biasing substrates
Recent Federal Awards
| Award | Agency | Amount | Date |
|---|---|---|---|
| OU03-26-015-NEW CHIPS R&D ELECTRICAL/THERMAL TEM HOLDER | Department of Commerce | $244K | |
| Federal contract award | Department of Defense | $150K | |
| Federal contract award | Department of Defense | $1.1M |
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Claim this profile See matched opportunitiesData compiled from public government sources including SAM.gov, USAspending.gov, and state procurement records. Last verified against federal award records. Inaccurate? Let us know.