About FRONTIER SEMICONDUCTOR
Frontier Semiconductor (FSM) provides advanced metrology products and solutions for semiconductor, LED, Solar, FPD, Data Storage, and MEMS applications. With over 25 years of experience, FSM specializes in stress measurement, film adhesion testing, wafer topography metrology, and electrical characterization.
Stress measurement and mapping for semiconductor, MEMS, optoelectronic, and flat panel applicationsFilm adhesion testing of thin films and stacks on substratesElectrical characterization systems for implantation, diffusion, and metallization3DIC TSV process control and monitoring stress of large flat panelsNon-contact laser scanning technology for wafer topography and thickness measurementThermal desorption, film shrinkage, reflectivity, and resistivity analysisLow coherence interferometry and laser scanning for metrologyThickness and total thickness variation (TTV) mapping systems
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