About ION-TOF USA, INC.
IONTOF USA provides advanced ion beam technology products for surface spectrometry, surface analysis, depth profiling, surface imaging, 3D analysis, and retrospective analysis. Their products include TOF-SIMS and LEIS instruments used across various industries.
Surface spectrometrySurface analysisDepth profilingSurface imaging3D analysisRetrospective analysisTOF-SIMS (time of flight secondary ion mass spectrometry)LEIS (low energy ion scattering)
Recent Federal Awards
| Award | Agency | Amount | Date |
|---|---|---|---|
| Federal contract award | Department of Defense | $40K | |
| Federal contract award | Department of Defense | $58K | |
| MAINTENANCE TOF.SIMS 5 AND M6 INSTRUMENTS, AS WELL AS THE VACUUM OPTION. | Department of Defense | $69K | |
| MASS SPECTROMETER MAINTENANCE | Department of Defense | $64K | |
| SIMS5 MASS SPECTROMETER MAINTENANCE | Department of Defense | $64K |
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Data compiled from public government sources including SAM.gov, USAspending.gov, and state procurement records. Last verified against federal award records. Inaccurate, or want this page removed? Request a correction or removal.