About AMAG CONSULTING, LLC
AMAG Nanometro provides calibration wafers and simulation software for the semiconductor metrology sector, offering IP-neutral solutions for metrology infrastructure development.
Development of high-performance IP-neutral calibration artifactsProduction of metrology-centric calibration wafers patterned in contemporary critical process levelsSimulation of scanning electron microscope (SEM) images and electron interactions with solidsCreation of a comprehensive library of calibration wafers using advanced metrology reticlesSupport for metrology R&D needs with leading-edge, mission-critical calibration samples
Recent Federal Awards
| Award | Agency | Amount | Date |
|---|---|---|---|
| SPECIALTY 300MM CU DAMASCENE WAFER FOR SEE-THROUGH SEM OVERLAY MEASUREMENTS. | Department of Commerce | $12K | |
| Federal contract award | Department of Commerce | $51K | |
| OU03-25-NEW-161 MONTE CARLO SOFTWARE (PERMANENT EDITION) | Department of Commerce | $130K |
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Claim this profile See matched opportunitiesData compiled from public government sources including SAM.gov, USAspending.gov, and state procurement records. Last verified against federal award records. Inaccurate? Let us know.