METRICON CORP — Federal Contracts, Awards & Government Contractor Profile

About METRICON CORP

Metricon's Model 2010/M provides high-accuracy refractive index and thickness measurements for thin films and bulk materials, with applications in optical waveguide characterization, sensor development, and materials science. The system uses prism coupling technology for minimal sample preparation and high precision.

Refractive index and thickness measurement for thin films and bulk materialsWaveguide loss measurementIndex vs temperature (dn/dT) measurementSpectroscopic measurements of index vs wavelength (dispersion)Measurement of refractive index and birefringence in bulk polymers and flexible polymer filmsMonitoring of dopant concentrations in silicon dioxideCharacterization of SPR (surface plasmon resonance) and waveguide structures for sensor applicationsMeasurement of refractive index of liquids inside sealed containers

Recent Federal Awards

Award	Agency	Amount	Date
Federal contract award	Department of Defense	$57K
Federal contract award	Department of Commerce	$59K

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Data compiled from public government sources including SAM.gov, USAspending.gov, and state procurement records. Last verified against federal award records. Inaccurate, or want this page removed? Request a correction or removal.